One of the possible risks posed to a patient with implanted devices during MRI is that conductive structures may pick up RF-energy during the exposure, and locally deposit it as heating in tissue near the implant. To assess the compatibility level, manufacturers of the medical devices must perform tests to predict the hazard in the worst-case exposure scenario.

Simulation has proven to be able to replicate the standard tests required by regulatory bodies with accuracy, providing evidence that can be used directly for labelling medical devices for MRI. Answers can be calculated in a few hours even for a family of devices, taking into consideration geometrical features, material, orientation of the device and applied RF frequency. 

NuMRis has been implemented in collaboration with the FDA and ANSYS and is based on models of the RF exposure system provided by the Center for Devices and Radiological Health within the U.S. Food and Drug Administration (FDA-CDRH). The simulation steps are designed following the ASTM F2182-19e2 Standard

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